{"@context":"http://schema.org","@id":"http://library.link/id/isbn/9781394210930/work","@type":"Book","contributor":[{"@id":"http://library.link/resource/0kbTUEJVU_Q","name":"ProQuest (Firme)","type":"http://bibfra.me/vocab/lite/Organization","url":"http://library.link/resource/0kbTUEJVU_Q"},{"@id":"http://library.link/resource/4VXq3r51dbc","name":"Bensoussan, Alain","type":"http://bibfra.me/vocab/lite/Person","url":"http://library.link/resource/4VXq3r51dbc"},{"@id":"http://library.link/resource/L7cv6ybxgUQ","name":"Bender, Emmanuel","type":"http://bibfra.me/vocab/lite/Person","url":"http://library.link/resource/L7cv6ybxgUQ"}],"creator":[{"@id":"http://library.link/resource/RUjhoM_WiQc","name":"Bernstein, Joseph B","type":"http://bibfra.me/vocab/lite/Person","url":"http://library.link/resource/RUjhoM_WiQc"}],"name":"Reliability Prediction for Microelectronics, Joseph B. Bernstein, Alain Bensoussan, and Emmanuel Bender - print","url":"http://library.link/id/isbn/9781394210930/resource","workExample":[{"@id":"http://library.link/id/isbn/9781394210930/resource","@type":"Book","bookFormat":["http://schema.org/EBook"],"isbn":"9781394210930","potentialAction":[]}]}